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The Stanford revision and extension of the Binet-Simon scale for measuring intelligence

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"The labors of Professor Terman and his co-workers at Stanford University in the critical examination and improvement of the Binet-Simon Scale for Measuring Intelligence are so well and so favorably known by psychologists and by the many users of the method that no words of editorial introducti...

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Bibliographic Details
Main Author: Terman, Lewis M. (Lewis Madison), 1877-1956
Format: eBook
Language:English
Published: Baltimore, Warwick & York, Inc., 1917.
Series:Educational psychology monographs ; no. 18.
Subjects:
Educational tests and measurements.
Intelligence tests.
Psychological tests.
Child development.
Child psychology.
Stanford-Binet Test.
Psychology, Child
Stanford-Binet Test
Educational Measurement
Intelligence Tests
Psychological Tests
Child Development
Child Behavior
Tests et mesures en éducation.
Intelligence > Tests.
Tests psychologiques.
Enfants > Développement.
Enfants > Psychologie.
Échelle de Stanford-Binet.
Child development
Child psychology
Educational tests and measurements
Intelligence tests
Psychological tests
Stanford-Binet Schaal.
Medidas De Inteligencia.
Electronic books.
Tables
Statistics
tables (documents)
Tables (Data)
Statistics.
Statistiques.
Tables (Données)
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Call Number: BF432.5.S8 S73 1917
 
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BF432.5.S8 S73 1917 Available