Improving tests for discrete small sample data /

This book provides a guide for improving test statistics that are based on phi-divergence for discrete models, which include various kinds of independence models of contingency tables as well as generalized linear models of binary data.--

Bibliographic Details
Main Authors: Taneichi, Nobuhiro (Author), Sekiya, Yuri (Author)
Format: eBook
Language:English
Published: Singapore : Springer, 2026.
Series:SpringerBriefs in statistics. JSS research series in statistics.
Subjects:
Description
Summary:This book provides a guide for improving test statistics that are based on phi-divergence for discrete models, which include various kinds of independence models of contingency tables as well as generalized linear models of binary data.--
Physical Description:1 online resource (xi, 125 pages) : illustrations.
Bibliography:Includes bibliographical references.
ISBN:9789819553013 (electronic bk.)
9819553016
ISSN:2364-0065