Improving tests for discrete small sample data /

This book provides a guide for improving test statistics that are based on phi-divergence for discrete models, which include various kinds of independence models of contingency tables as well as generalized linear models of binary data.--

Bibliographic Details
Main Authors: Taneichi, Nobuhiro (Author), Sekiya, Yuri (Author)
Format: eBook
Language:English
Published: Singapore : Springer, 2026.
Series:SpringerBriefs in statistics. JSS research series in statistics.
Subjects:

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Call Number: QA276 .T35 2026
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