Proceedings.

Bibliographic Details
Corporate Authors:	Asian Test Symposium, IEEE Computer Society. Test Technology Technical Committee, IEEE Xplore (Online service)
Format:	Conference Proceeding
Language:	English
Published:	Los Alamitos, Calif. : IEEE Computer Society Press, ©1992-
Subjects:	Electronic circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Fault-tolerant computing > Congresses. Electronic circuits > Testing. Electronic digital computers > Circuits > Testing. Fault-tolerant computing. Electronic journals. Periodicals. Conference papers and proceedings.
Online Access:	Google Google Google Google Google HathiTrust Digital Library http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000754
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