Technological Improvements in Devices Fabrication Special topic volume with invited peer-reviewed papers only

This special edition provides a comprehensive overview of the latest process enhancements that underpin the continued advancement of SiC-based device technologies by addressing methods of compound semiconductor processing and technologies of electronics device structure forming with a focus on end-d...

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Bibliographic Details

Corporate Author:	Knovel (Firm)
Other Authors:	Veliadis, Victor (Editor), Salemi, Arash (Editor)
Format:	eBook
Language:	English
Published:	Switzerland : Trans Tech Publications Ltd, 2025.
Series:	Materials Science Forum Vol. 1159
Subjects:	Argon Plasma Treatment. Contact Formation. Contact Resistance. Gate Oxide. Gate Oxide Lifetime. Laser Ablation. Laser Annealing. Plasma Dicing. Schottky Barrier Diodes. Schottky Contacts. Silicon Carbide. Sulfurization. Trench Etching. Wafer Dicing. Electronic books.
Online Access:	Connect to the full text of this electronic book