SPATIO-TEMPORAL ABNORMALITY DIAGNOSIS FOR INDUSTRIAL DISTRIBUTED PARAMETER SYSTEMS model... -based and data-driven perspectives.

This book introduces recent developments and trends of S-T abnormality diagnosis for industrial distributed parameter systems (DPSs). As a typical representative of industrial processes, DPSs widely exist in both process and discrete manufacturing and operations, such as the snap curing oven in chip...

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Bibliographic Details
Main Author: FENG, YUN. LI, HAN-XIONG. WANG, YAONAN
Format: Electronic eBook
Language:English
Published: [S.l.] : SPRINGER VERLAG, SINGAPOR, 2026.
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Call Number: T59.5
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