Cover Image

Morphological image operators /

Show other versions (1)

Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle o...

Full description

Bibliographic Details
Main Author: Heijmans, Henk J. A. M. (Author)
Corporate Author: ScienceDirect (Online service)
Other Authors: Hÿtch, Martin (Editor), Hawkes, P. W. (Editor)
Format: eBook
Language:English
Published: Amsterdam, The Netherlands ; London : Elsevier Academic Press, 2020.
Edition:First edition.
Series:Advances in imaging and electron physics ; v. 216.
Subjects:
Image processing > Mathematics.
Morphisms (Mathematics)
Lattice theory.
Traitement d'images > Mathématiques.
Morphismes (Mathématiques)
Théorie des treillis.
Mechanical.
Electronics.
TECHNOLOGY & ENGINEERING.
Digital.
Microelectronics.
Materials Science.
Optics.
Signals & Signal Processing.
Image processing > Mathematics
Lattice theory
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Summary:Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource.
Item Description:"Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains."--Publisher's web page, viewed September 1, 2020
Physical Description:1 online resource (xvii, 502 pages) : illustrations (some color).
Bibliography:Includes bibliographical references and index.
ISBN:9780128210048
0128210044
ISSN:1076-5670 ;