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Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle o...

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Bibliographic Details
Main Author: Heijmans, Henk J. A. M. (Author)
Corporate Author: ScienceDirect (Online service)
Other Authors: Hÿtch, Martin (Editor), Hawkes, P. W. (Editor)
Format: eBook
Language:English
Published: Amsterdam, The Netherlands ; London : Elsevier Academic Press, 2020.
Edition:First edition.
Series:Advances in imaging and electron physics ; v. 216.
Subjects:
Image processing > Mathematics.
Morphisms (Mathematics)
Lattice theory.
Traitement d'images > Mathématiques.
Morphismes (Mathématiques)
Théorie des treillis.
Mechanical.
Electronics.
TECHNOLOGY & ENGINEERING.
Digital.
Microelectronics.
Materials Science.
Optics.
Signals & Signal Processing.
Image processing > Mathematics
Lattice theory
Electronic books.
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Call Number: TA1637.5 .H45 2020
 
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TA1637.5 .H45 2020 Available