Klapetek, P. (2018). Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology (2nd ed.). Elsevier Science.
Chicago Style (17th ed.) CitationKlapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. 2nd ed. San Diego: Elsevier Science, 2018.
MLA (9th ed.) CitationKlapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. 2nd ed. Elsevier Science, 2018.
Warning: These citations may not always be 100% accurate.