Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading f...

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Bibliographic Details

Main Author:	Klapetek, Petr
Corporate Author:	ScienceDirect (Online service)
Format:	eBook
Language:	English
Published:	San Diego : Elsevier Science, 2018.
Edition:	2nd ed.
Series:	Micro & nano technologies.
Subjects:	Scanning probe microscopy. Nanostructures > Measurement. Microscopy, Scanning Probe Microscopie à sonde à balayage. SCIENCE > General. Scanning probe microscopy Electronic books.
Online Access:	Connect to the full text of this electronic book