VLSI reliability /
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
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| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
San Diego :
Academic Press,
1990.
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| Series: | VLSI electronics ;
v. 22. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Summary: | As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging. |
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| Physical Description: | 1 online resource (xiii, 207 pages) : illustrations |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9781483296586 148329658X |