VLSI reliability /
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
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| Format: | eBook |
| Language: | English |
| Published: |
San Diego :
Academic Press,
1990.
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| Series: | VLSI electronics ;
v. 22. |
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| Online Access: | Connect to the full text of this electronic book |
Internet
Connect to the full text of this electronic bookAvailable Online
| Call Number: |
TK7874 .V56 vol. 22eb |
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| Call Number | Status | Get It |
| TK7874 .V56 vol. 22eb | Available | |