VLSI reliability /

As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.

Bibliographic Details
Main Author: Sabnis, Anant G.
Corporate Author: ScienceDirect (Online service)
Format: eBook
Language:English
Published: San Diego : Academic Press, 1990.
Series:VLSI electronics ; v. 22.
Subjects:
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Call Number: TK7874 .V56 vol. 22eb
 
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TK7874 .V56 vol. 22eb Available