Hybrid microcircuit reliability data /

Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent c...

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Bibliographic Details
Corporate Authors: IIT Research Institute, ScienceDirect (Online service)
Format: eBook
Language:English
Published: Oxford ; New York : Pergamon Press, 1976.
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Call Number: TK7874 .I33 1976eb
 
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TK7874 .I33 1976eb Available