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Fundamental principles of engineering nanometrology /

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Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rig...

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Bibliographic Details
Main Author: Leach, R. K. (Author)
Corporate Author: ScienceDirect (Online service)
Format: eBook
Language:English
Published: Oxford, OX : Elsevier, William Andrew, 2014.
Edition:Second edition.
Series:Micro & nano technologies.
Subjects:
Nanotechnology.
Microtechnology.
Metrology.
Microtechnologie.
Métrologie.
Nanotechnologie.
TECHNOLOGY & ENGINEERING > Engineering (General)
TECHNOLOGY & ENGINEERING > Reference.
Metrology
Microtechnology
Nanotechnology
Electronic books.
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by Leach, R. K.
Published 2010
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by Leach, R. K.
Published 2010
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eBook
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