Fundamental principles of engineering nanometrology /

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rig...

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Bibliographic Details

Main Author:	Leach, R. K. (Author)
Corporate Author:	ScienceDirect (Online service)
Format:	eBook
Language:	English
Published:	Oxford, OX : Elsevier, William Andrew, 2014.
Edition:	Second edition.
Series:	Micro & nano technologies.
Subjects:	Nanotechnology. Microtechnology. Metrology. Microtechnologie. Métrologie. Nanotechnologie. TECHNOLOGY & ENGINEERING > Engineering (General) TECHNOLOGY & ENGINEERING > Reference. Metrology Microtechnology Nanotechnology Electronic books.
Online Access:	Connect to the full text of this electronic book