Fundamental principles of engineering nanometrology /

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rig...

Full description

Bibliographic Details

Main Author:	Leach, R. K.
Corporate Author:	ScienceDirect (Online service)
Format:	eBook
Language:	English
Published:	Oxford : William Andrew : Elsevier Science, 2010.
Edition:	First edition.
Series:	Micro & nano technologies.
Subjects:	Nanotechnology. Microtechnology. Metrology. Microtechnologie. Métrologie. Nanotechnologie. Nanotechnologies. Metrology Microtechnology Nanotechnology Metrologie Nanostruktur Nanotechnologie Electronic books.
Online Access:	Connect to the full text of this electronic book