Reliability prediction from burn-in data fit to reliability models /
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability pu...
| Main Author: | Bernstein, Joseph B. (Author) |
|---|---|
| Corporate Author: | ScienceDirect (Online service) |
| Format: | eBook |
| Language: | English |
| Published: |
London [England] :
Elsevier,
2014.
|
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
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