Reliability prediction from burn-in data fit to reliability models /
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability pu...
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| Format: | eBook |
| Language: | English |
| Published: |
London [England] :
Elsevier,
2014.
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| Online Access: | Connect to the full text of this electronic book |
Internet
Connect to the full text of this electronic bookAvailable Online
| Call Number: |
TA169 .B476 2014eb |
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| Call Number | Status | Get It |
| TA169 .B476 2014eb | Available | |