Reliability prediction from burn-in data fit to reliability models /

This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability pu...

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Bibliographic Details
Main Author: Bernstein, Joseph B. (Author)
Corporate Author: ScienceDirect (Online service)
Format: eBook
Language:English
Published: London [England] : Elsevier, 2014.
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Call Number: TA169 .B476 2014eb
 
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TA169 .B476 2014eb Available