APA (7th ed.) Citation

International Conference on the Science and Technology of Defect Control in Semiconductors Yokohama-shi, Japan, ScienceDirect (Online service), & Sumino, K. (1990). Defect control in semiconductors: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. North-Holland ; Distributors for the U.S. and Canada, Elsevier Science Pub. Co..

Chicago Style (17th ed.) Citation

International Conference on the Science and Technology of Defect Control in Semiconductors Yokohama-shi, Japan, ScienceDirect (Online service), and K. Sumino. Defect Control in Semiconductors: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st Century Forum, Yokohama, Japan, September 17-22 1989. Amsterdam ; New York : New York, N.Y., U.S.A.: North-Holland ; Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990.

MLA (9th ed.) Citation

International Conference on the Science and Technology of Defect Control in Semiconductors Yokohama-shi, Japan, et al. Defect Control in Semiconductors: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st Century Forum, Yokohama, Japan, September 17-22 1989. North-Holland ; Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990.