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Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2 /

Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defec...

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Bibliographic Details
Corporate Authors: International Conference on the Science and Technology of Defect Control in Semiconductors Yokohama-shi, Japan, ScienceDirect (Online service)
Other Authors: Sumino, K. (Kōji), 1931-
Format: Conference Proceeding eBook
Language:English
Published: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990.
Subjects:
Semiconductors > Defects > Congresses.
Materials > Defects > Congresses.
Semi-conducteurs > Défauts > Congrès.
Matériaux > Défauts > Congrès.
Materials > Defects
Semiconductors > Defects
Electronic books.
Congress
proceedings (reports)
Conference papers and proceedings
Conference papers and proceedings.
Actes de congrès.
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Call Number: QC611.6.D4 I583 1989eb
 
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