Digital circuit testing : a guide to DFT and other techniques /

"Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of el...

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Bibliographic Details
Main Author: Wang, Francis C.
Corporate Author: ScienceDirect (Online service)
Format: eBook
Language:English
Published: San Diego : Academic Press, ©1991.
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Call Number: TK7874 .W363 1991eb
 
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