Silicon-based millimeter-wave technology measurement, modeling and applications /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
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| Format: | eBook |
| Language: | English |
| Published: |
Amsterdam :
Elsevier/Academic Press,
2012.
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| Series: | Advances in imaging and electron physics ;
v. 174. |
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| Online Access: | Connect to the full text of this electronic book |
Internet
Connect to the full text of this electronic bookAvailable Online
| Call Number: |
TK7876.5 .S54 2012eb |
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| Call Number | Status | Get It |
| TK7876.5 .S54 2012eb | Available | |