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Optical characterization of semiconductors : infrared, Raman, and photoluminescence spectroscopy /

Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a...

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Bibliographic Details
Main Author: Perkowitz, S.
Corporate Author: ScienceDirect (Online service)
Format: eBook
Language:English
Published: London ; San Diego : Academic Press, ©1993.
Series:Techniques of physics ; 14.
Subjects:
Semiconductors > Testing > Optical methods.
Semi-conducteurs > Essais > Méthodes optiques.
TECHNOLOGY & ENGINEERING > Electronics > Semiconductors.
TECHNOLOGY & ENGINEERING > Electronics > Solid State.
Semiconductors > Testing > Optical methods
Halbleiter
Spektroskopie
Spectroscopie infrarouge.
Spectroscopie Raman.
Photoluminescence.
Semiconducteurs > Propriétés optiques.
Semiconductors > Optical properties.
Semiconductors > Optical properties
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Call Number: TK7871.85 .P426 1993
 
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