SEM microcharacterization of semiconductors /

Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron b...

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Bibliographic Details

Corporate Author:	ScienceDirect (Online service)
Other Authors:	Holt, D. B., Joy, David C., 1943-
Format:	eBook
Language:	English
Published:	London [England] ; San Diego, CA : Academic, ©1989.
Series:	Techniques of physics ; 12.
Subjects:	Semiconductors. Scanning electron microscopes. Semiconductors Semi-conducteurs. Microscopes électroniques à balayage. semiconductor. Scanning electron microscopes 11030 > semiconductor devices Electronic books.
Online Access:	Connect to the full text of this electronic book