| Tag |
First Indicator |
Second Indicator |
Subfields |
| LEADER |
00000cam a2200000 a 4500 |
| 001 |
in00005747721 |
| 005 |
20260326185429.4 |
| 006 |
m o d |
| 007 |
cr bn||||||ada |
| 008 |
110315s1994 maua ob 001 0 eng d |
| 040 |
|
|
|a OCLCE
|b eng
|e pn
|c OCLCE
|d OCLCQ
|d OCLCF
|d OCLCQ
|d OPELS
|d E7B
|d OCLCQ
|d OCLCO
|d OCLCQ
|d OCLCO
|d OCLCL
|d OCLCQ
|
| 020 |
|
|
|a 0125330197
|q (electronic bk.)
|
| 020 |
|
|
|a 9780125330190
|q (electronic bk.)
|
| 035 |
|
|
|a (OCoLC)707421478
|
| 042 |
|
|
|a dlr
|
| 050 |
|
4 |
|a QC1
|b .P5885 v.19
|
| 082 |
0 |
4 |
|a 530.82
|b P578, v.19
|
| 049 |
|
|
|a TXAM
|
| 245 |
0 |
0 |
|a Optical characterization of real surfaces and films /
|c guest volume editor, K. Vedam.
|
| 260 |
|
|
|a Boston :
|b Academic Press,
|c 1994.
|
| 300 |
|
|
|a 1 online resource (xv, 328 pages) :
|b illustrations
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a computer
|b c
|2 rdamedia
|
| 338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
| 490 |
0 |
|
|a Physics of thin films ;
|v v. 19
|
| 504 |
|
|
|a Includes bibliographical references and indexes.
|
| 538 |
|
|
|a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
|u http://purl.oclc.org/DLF/benchrepro0212
|5 MiAaHDL
|
| 583 |
1 |
|
|a digitized
|c 2011
|h HathiTrust Digital Library
|l committed to preserve
|2 pda
|5 MiAaHDL
|
| 588 |
0 |
|
|a Print version record.
|
| 520 |
|
|
|a This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
|
| 650 |
|
0 |
|a Thin films.
|
| 650 |
|
6 |
|a Couches minces.
|
| 650 |
|
7 |
|a Thin films
|2 fast
|
| 655 |
|
7 |
|a Electronic books.
|2 local
|
| 700 |
1 |
|
|a Vedam, K.
|
| 710 |
2 |
|
|a ScienceDirect (Online service)
|
| 758 |
|
|
|i has work:
|a Optical Characterization of Real Surfaces and Films (Text)
|1 https://id.oclc.org/worldcat/entity/E39PD389KKdwfVFDd79mxVJwwd
|4 https://id.oclc.org/worldcat/ontology/hasWork
|
| 776 |
0 |
8 |
|i Print version:
|t Optical characterization of real surfaces and films.
|d Boston : Academic Press, 1994
|w (OCoLC)31698495
|
| 856 |
4 |
0 |
|u http://proxy.library.tamu.edu/login?url=https://www.sciencedirect.com/science/bookseries/00791970/19
|z Connect to the full text of this electronic book
|t 0
|
| 955 |
|
|
|a Elsevier ScienceDirect 2026-2027
|
| 994 |
|
|
|a 92
|b TXA
|
| 999 |
f |
f |
|i d106b600-8c0f-4eba-82b3-d9c4c027f5b0
|s 8b6f135f-0491-45f8-8148-e87ecdac08b5
|t 0
|
| 952 |
f |
f |
|a Texas A&M University
|b College Station
|c Electronic Resources
|s www_evans
|d Available Online
|t 0
|e QC1 .P5885 v.19
|h Library of Congress classification
|
| 998 |
f |
f |
|a QC1 .P5885 v.19
|t 0
|l Available Online
|