Optical characterization of real surfaces and films /

This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverag...

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Bibliographic Details

Corporate Author:	ScienceDirect (Online service)
Other Authors:	Vedam, K.
Format:	eBook
Language:	English
Published:	Boston : Academic Press, 1994.
Series:	Physics of thin films ; v. 19
Subjects:	Thin films. Couches minces. Thin films Electronic books.
Online Access:	Connect to the full text of this electronic book