Pattern recognition in practice II : proceedings of an international workshop held in Amsterdam, June 19-21, 1985 /

The 1985 Amsterdam conference brought together researchers active in pattern recognition methodology and the development of practical applications. The first part of the book covers various methodological aspects of image processing, knowledge based and model driven image understanding systems, 3-D...

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Bibliographic Details
Corporate Author: ScienceDirect (Online service)
Other Authors: Gelsema, Edzard S., 1937-, Kanal, Laveen N.
Format: eBook
Language:English
Language Notes:English.
Published: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
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Call Number: Q327 .P378 1986
 
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Q327 .P378 1986 Available