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Materials analysis by ion channeling : submicron crystallography /

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Our intention has been to write a book that would be useful to people with a variety of levels of interest in this subject. Clearly it should be useful to both graduate students and workers in the field. We have attempted to bring together many of the concepts used in channeling beam analysis with a...

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Bibliographic Details
Main Author: Feldman, Leonard C.
Corporate Author: ScienceDirect (Online service)
Other Authors: Mayer, James W., 1930-, Picraux, S. T., 1943-
Format: eBook
Language:English
Published: New York : Academic Press, 1982.
Subjects:
Channeling (Physics)
Solids > Surfaces.
Crystals > Defects.
Ion bombardment.
Crystallography.
Canalisation (Physique)
Cristaux > Défauts.
Bombardement ionique.
Cristallographie.
SCIENCE > Nanoscience.
Crystallography
Crystals > Defects
Ion bombardment
Solids > Surfaces
Channeling
Ionenstrahl
Kristallographie
Sekundärionen-Massenspektrometrie
Tunneleffekt
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Call Number: QC176.8.C45 F44 1982
 
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QC176.8.C45 F44 1982 Available