Atomic force microscopy in process engineering : introduction to AFM for improved processes and products /

Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process en...

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Bibliographic Details

Corporate Author:	ScienceDirect (Online service)
Other Authors:	Bowen, W. Richard, Hilal, Nidal
Format:	eBook
Language:	English
Language Notes:	English.
Published:	Oxford ; Burlington, MA : Butterworth-Heinemann, ©2009.
Edition:	1st ed.
Series:	Butterworth-Heinemann/IChemE series.
Subjects:	Atomic force microscopy. Production engineering. Microscopie à force atomique. Technique de la production. TECHNOLOGY & ENGINEERING > Nanotechnology & MEMS. Atomic force microscopy Production engineering Electronic books.
Online Access:	Connect to the full text of this electronic book