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Optics of charged particle analyzers /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Bibliographic Details
Main Author: Yavor, Mikhail
Corporate Author: ScienceDirect (Online service)
Format: eBook
Language:English
Published: Amsterdam ; Boston : Academic Press, 2009.
Edition:1st ed.
Series:Advances in imaging and electron physics ; 157.
Subjects:
Particles (Nuclear physics)
Electron optics.
Nuclear physics > Instruments.
Particules (Physique nucléaire)
Optique électronique.
Physique nucléaire > Instruments.
particle physics.
SCIENCE > Physics > Nuclear.
SCIENCE > Physics > Atomic & Molecular.
Electron optics
Nuclear physics > Instruments
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Charged particles in electromagnetic fields
  • Language of aberration expansions in charged particle optics
  • Transporting charged particle beams in static fields
  • Transporting charged particles in radiofrequency fields
  • Static magnetic charged particle analyzers
  • Electrostatic energy analyzers
  • Mass analyzers with combined electrostatic and magnetic fields
  • Time-of-flight mass analyzers
  • Radiofrequency mass analyzers.