Optics of charged particle analyzers /
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
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| Format: | eBook |
| Language: | English |
| Published: |
Amsterdam ; Boston :
Academic Press,
2009.
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| Edition: | 1st ed. |
| Series: | Advances in imaging and electron physics ;
157. |
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| Online Access: | Connect to the full text of this electronic book |
Internet
Connect to the full text of this electronic bookAvailable Online
| Call Number: |
QC793.5.E62 Y38 2009eb |
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| Call Number | Status | Get It |
| QC793.5.E62 Y38 2009eb | Available | |