Principles of semiconductor network testing /

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor...

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Bibliographic Details
Main Author:	Afshar, Amir
Corporate Author:	ScienceDirect (Online service)
Format:	eBook
Language:	English
Published:	Boston : Butterworth-Heinemann, ©1995. ©1995
Subjects:	Integrated circuits > Testing. Semiconductors > Testing. Semi-conducteurs > Essais. TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated. TECHNOLOGY & ENGINEERING > Electronics > Circuits > General. Integrated circuits > Testing Semiconductors > Testing Electronic books.
Online Access:	Connect to the full text of this electronic book

Description
Summary:	This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.
Physical Description:	1 online resource (xiv, 213 pages) : illustrations
Format:	Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:	Includes bibliographical references and index.
ISBN:	9780080539560 0080539564