Cover Image

Principles of semiconductor network testing /

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor...

Full description

Bibliographic Details
Main Author: Afshar, Amir
Corporate Author: ScienceDirect (Online service)
Format: eBook
Language:English
Published: Boston : Butterworth-Heinemann, ©1995.
©1995
Subjects:
Integrated circuits > Testing.
Semiconductors > Testing.
Semi-conducteurs > Essais.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Integrated circuits > Testing
Semiconductors > Testing
Electronic books.
Online Access:Connect to the full text of this electronic book

Internet

Connect to the full text of this electronic book

Available Online

Holdings details from Available Online
Call Number: TK7874 .A339 1995eb
 
Call Number Status Get It
TK7874 .A339 1995eb Available