ScienceDirect (Online service), Wang, L., Wu, C., & Wen, X. (2006). VLSI test principles and architectures: Design for testability. Elsevier Morgan Kaufmann Publishers.
Chicago Style (17th ed.) CitationScienceDirect (Online service), Laung-Terng Wang, Cheng-Wen Wu, and Xiaoqing Wen. VLSI Test Principles and Architectures: Design for Testability. Amsterdam ; Boston: Elsevier Morgan Kaufmann Publishers, 2006.
MLA (9th ed.) CitationScienceDirect (Online service), et al. VLSI Test Principles and Architectures: Design for Testability. Elsevier Morgan Kaufmann Publishers, 2006.
Warning: These citations may not always be 100% accurate.