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VLSI test principles and architectures : design for testability /

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of indu...

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Bibliographic Details
Corporate Author: ScienceDirect (Online service)
Other Authors: Wang, Laung-Terng (Editor), Wu, Cheng-Wen, EE Ph. D. (Editor), Wen, Xiaoqing (Editor)
Format: eBook
Language:English
Published: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, [2006]
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Integrated circuits > Very large scale integration > Design and construction.
Circuits intégrés à très grande échelle > Essais.
Circuits intégrés à très grande échelle > Conception et construction.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > VLSI & ULSI.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Logic.
COMPUTERS > Logic Design.
Integrated circuits > Very large scale integration > Design and construction
Integrated circuits > Very large scale integration > Design
Integrated circuits > Very large scale integration > Testing
Testen
VLSI
Circuitos integrados vlsi.
Electronic books.
dissertations.
Academic theses
Academic theses.
Thèses et écrits académiques.
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Call Number: TK7874.75 .V587 2006eb
 
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TK7874.75 .V587 2006eb Available