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Electronics reliability and measurement technology : nondestructive evaluation /

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This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

Bibliographic Details
Corporate Author: ScienceDirect (Online service)
Other Authors: Heyman, Joseph S.
Format: eBook
Language:English
Language Notes:English.
Published: Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.
Subjects:
Integrated circuits > Reliability > Congresses.
Nondestructive testing > Congresses.
Integrated circuits > Testing > Congresses.
Circuits intégrés > Fiabilité > Congrès.
Contrôle non destructif > Congrès.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
Integrated circuits > Reliability
Integrated circuits > Testing
Nondestructive testing
Elektronik
Elektronische Schaltung
Kongress
Zuverlässigkeit
Electronic books.
proceedings (reports)
Conference papers and proceedings
Conference papers and proceedings.
Actes de congrès.
Hampton (Va., 1986)
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Call Number: TK7874 .E486 1988eb
 
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TK7874 .E486 1988eb Available