APA (7th ed.) Citation

Taylor & Francis & Cressler, J. D. (2008). Measurement and modeling of silicon heterostructure devices. CRC Press.

Chicago Style (17th ed.) Citation

Taylor & Francis and John D. Cressler. Measurement and Modeling of Silicon Heterostructure Devices. Boca Raton, FL: CRC Press, 2008.

MLA (9th ed.) Citation

Taylor & Francis and John D. Cressler. Measurement and Modeling of Silicon Heterostructure Devices. CRC Press, 2008.