Measurement and modeling of silicon heterostructure devices /

When you see a nicely presented set of data, the natural response is: "How did they do that; what tricks did they use; and how can I do that for myself?" Alas, usually, you must simply keep wondering, since such tricks-of- the-trade are usually held close to the vest and rarely divulged. S...

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Bibliographic Details
Corporate Author: Taylor & Francis
Other Authors: Cressler, John D.
Format: eBook
Language:English
Published: Boca Raton, FL : CRC Press, ©2008.
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Call Number: TK7871.96.B55 M33 2008
 
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