Proceedings of the ... IEEE VLSI Test Symposium : VTS.

Bibliographic Details
Previous Title:	IEEE VLSI Test Symposium. Digest of papers
Corporate Authors:	IEEE VLSI Test Symposium, IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding
Language:	English
Published:	[Los Alamitos, Calif.] : [IEEE Computer Society Press]
Subjects:	Integrated circuits > Very large scale integration > Testing > Congresses. Integrated circuits > Very large scale integration > Testing. Electronic journals. Conference papers and proceedings.
Online Availability:

Available Online