Cover Image

Automating software defect detection through machine learning and LLMs /

"This book provides a comprehensive understanding of how machine learning and large language models revolutionize the process of software defect detection"-- Provided by publisher.

Bibliographic Details
Other Authors: Gardiner, Bryan, 1983- (Editor), Singh, Pancham, 1981- (Editor), Upadhyay, Prashant, 1991- (Editor), Malhotra, Meetu, 1982- (Editor), Sharma, Rahul, 1986- (Editor)
Format: eBook
Language:English
Published: Hershey, PA : IGI Global Scientific Publishing, [2026]
Subjects:
Computer software > Quality control > Data processing.
Software engineering > Quality control > Data processing.
Machine learning > Industrial applications.
Apprentissage automatique > Applications industrielles.
Description
Summary:"This book provides a comprehensive understanding of how machine learning and large language models revolutionize the process of software defect detection"-- Provided by publisher.
Physical Description:1 online resource.
Bibliography:Includes bibliographical references and index.
ISBN:9798337344621 (electronic bk.)