Automating software defect detection through machine learning and LLMs /

"This book provides a comprehensive understanding of how machine learning and large language models revolutionize the process of software defect detection"-- Provided by publisher.

Bibliographic Details
Other Authors: Gardiner, Bryan, 1983- (Editor), Singh, Pancham, 1981- (Editor), Upadhyay, Prashant, 1991- (Editor), Malhotra, Meetu, 1982- (Editor), Sharma, Rahul, 1986- (Editor)
Format: eBook
Language:English
Published: Hershey, PA : IGI Global Scientific Publishing, [2026]
Subjects:

Purchase on Demand

Holdings details from Purchase on Demand
Call Number: QA76.76.Q35 A86 2026eb
Notes: This title is available for the library to purchase for your use. Click the "Purchase It For Me" button to place a request. This item will take 5-10 business days to arrive.
 
Call Number Status Get It
QA76.76.Q35 A86 2026eb Available