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Bibliographic Details
Previous Title:IEEE Semiconductor Thermal and Temperature Measurement Symposium. Proceedings
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium, IEEE Components, Hybrids, and Manufacturing Technology Society
Format: Conference Proceeding
Language:English
Published: New York, NY : Institute of Electrical and Electronics Engineers, 1991-
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Amorphous semiconductors > Thermal properties > Congresses.
Integrated circuits > Congresses.
Amorphous semiconductors > Thermal properties.
Integrated circuits.
Semiconductors > Cooling.
Semiconductors > Thermal properties.
Electronic journals.
Conference papers and proceedings.
Online Availability: Check for online availability
Description
Published:Began with: 7th (1991).
Publication Frequency:Annual
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
ISSN:2577-1000
1065-2221