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Bibliographic Details
Previous Title:	IEEE Semiconductor Thermal and Temperature Measurement Symposium. Proceedings
Corporate Authors:	IEEE Semiconductor Thermal Measurement and Management Symposium, IEEE Components, Hybrids, and Manufacturing Technology Society
Format:	Conference Proceeding
Language:	English
Published:	New York, NY : Institute of Electrical and Electronics Engineers, 1991-
Subjects:	Semiconductors > Thermal properties > Congresses. Semiconductors > Cooling > Congresses. Amorphous semiconductors > Thermal properties > Congresses. Integrated circuits > Congresses. Amorphous semiconductors > Thermal properties. Integrated circuits. Semiconductors > Cooling. Semiconductors > Thermal properties. Electronic journals. Conference papers and proceedings.
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