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Proceedings /

Bibliographic Details
Previous Title:International Test Conference. Digest of papers
Corporate Authors: International Test Conference, IEEE Computer Society, Institute of Electrical and Electronics Engineers
Format: Conference Proceeding
Language:English
Published: [Silver Spring, Md.] : [IEEE Computer Society Press]
Altoona, PA : International Test Conference
Washington, D.C. :
Subjects:
Computer storage devices > Congresses.
Integrated circuits > Testing > Congresses.
Semiconductor storage devices > Testing > Congresses.
Computer storage devices.
Integrated circuits > Testing.
Semiconductor storage devices > Testing.
Electronic journals.
Periodicals.
Conference papers and proceedings.
Online Availability: Check for online availability
Description
Published:Print began with 1983.
Item Description:Some conferences also have distinctive titles.
Published: Altoona, PA : International Test Conference, <1995->
Publication Frequency:Annual
ISSN:2378-2250
1089-3539