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Bibliographic Details
Previous Title:	International Test Conference. Digest of papers
Corporate Authors:	International Test Conference, IEEE Computer Society, Institute of Electrical and Electronics Engineers
Format:	Conference Proceeding
Language:	English
Published:	[Silver Spring, Md.] : [IEEE Computer Society Press] Altoona, PA : International Test Conference Washington, D.C. :
Subjects:	Computer storage devices > Congresses. Integrated circuits > Testing > Congresses. Semiconductor storage devices > Testing > Congresses. Computer storage devices. Integrated circuits > Testing. Semiconductor storage devices > Testing. Electronic journals. Periodicals. Conference papers and proceedings.
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