Proceedings /

Bibliographic Details
Corporate Authors:	IEEE International High-Level Design Validation and Test Workshop, IEEE Computer Society. Technical Council on Test Technology, IEEE Computer Society. Design Automation Technical Committee
Format:	Conference Proceeding
Language:	English
Published:	Los Alamitos, Calif. : IEEE Computer Society
Subjects:	Integrated circuits > Verification > Congresses. Integrated circuits > Design and construction > Congresses. Electronic circuits > Testing > Congresses. Microprocessors > Testing > Congresses. Electronic circuits > Testing. Integrated circuits > Design and construction. Integrated circuits > Verification. Microprocessors > Testing. Electronic journals. Periodicals. Conference papers and proceedings.
Online Access:	http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000333
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