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Proceedings /

Bibliographic Details
Corporate Authors: IEEE International High-Level Design Validation and Test Workshop, IEEE Computer Society. Technical Council on Test Technology, IEEE Computer Society. Design Automation Technical Committee
Format: Conference Proceeding
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society
Subjects:
Integrated circuits > Verification > Congresses.
Integrated circuits > Design and construction > Congresses.
Electronic circuits > Testing > Congresses.
Microprocessors > Testing > Congresses.
Electronic circuits > Testing.
Integrated circuits > Design and construction.
Integrated circuits > Verification.
Microprocessors > Testing.
Electronic journals.
Periodicals.
Conference papers and proceedings.
Online Access:http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000333
Online Availability: Check for online availability
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