Scanning electron microscopy and x-ray microanalysis /
This thoroughly revised and updated fourth edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...
| Main Authors: | , , , , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York :
Springer,
[2018].
|
| Edition: | Fourth edition. |
| Subjects: |
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