Scanning electron microscopy and x-ray microanalysis /
This thoroughly revised and updated fourth edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...
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Bibliographic Details
| Main Authors: |
Goldstein, Joseph, 1939-2015
(Author),
Newbury, Dale E.
(Author),
Michael, Joseph R.
(Author),
Ritchie, Nicholas W. M.
(Author),
Scott, John Henry J.
(Author),
Joy, David C., 1943-
(Author) |
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| Format: | Book
|
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| Language: | English |
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| Published: |
New York :
Springer,
[2018].
|
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| Edition: | Fourth edition. |
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| Subjects: | |
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