Advancements in AI and IoT for chip manufacturing and defect prevention /

This is essential reading for semiconductor professionals seeking to expand their knowledge on silicon processes, understand the significance of defect prevention, and explore methods for optimizing processes by reducing defects using AI and IoT technologies. In the dynamic landscape of semiconducto...

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Bibliographic Details

Main Author:	Jain, Rupal (Author)
Corporate Author:	Taylor & Francis
Format:	eBook
Language:	English
Published:	[United States] : River Publishers, [2024]
Series:	River rapids.
Subjects:	Semiconductors. Semiconductors > Defects. Artificial intelligence > Industrial applications. Internet of things. Semi-conducteurs. Semi-conducteurs > Défauts. Intelligence artificielle > Applications industrielles. Internet des objets. semiconductor. COMPUTERS / Artificial Intelligence TECHNOLOGY / Electronics / Semiconductors TECHNOLOGY / Electronics / Circuits / Integrated Electronic books.
Online Access:	Connect to the full text of this electronic book